X-ray reflectivity study of a W/Si multilayer gratting
Document title: X-ray reflectivity study of a W/Si multilayer gratting
Journal: Superficies y vacío
Database: PERIÓDICA
System number: 000252033
ISSN: 1665-3521
Authors: 1
2

3
Institutions: 1Instituto Politécnico Nacional, Centro de Investigación y de Estudios Avanzados, México, Distrito Federal. México
2Fraunhhofer Institut fur Zerstorungsfreie Prufverfahren, Dresden, Sajonia. Alemania
3Slovak Academy of Sciences, Bratislava. Eslovaquia
Year:
Season: Dic
Volumen: 13
Pages: 10-14
Country: México
Language: Inglés
Document type: Artículo
Approach: Experimental
Disciplines: Física y astronomía
Keyword: Física,
Multicapas,
Alambres cuánticos,
Difracción,
Reflectividad
Keyword: Physics and astronomy,
Physics,
Multilayers,
Quantum wires,
Diffraction,
Reflectivity
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