Elipsometria de filmes finos
Document title: Elipsometria de filmes finos
Journal: Spectrum
Database: PERIÓDICA
System number: 000041582
ISSN: 0101-1529
Authors: 1
Institutions: 1Gaertner Scientific Corp, Chicago, Illinois. Estados Unidos de América
Year:
Season: Jul-Ago
Volumen: 2
Number: 8
Pages: 79-81
Country: Brasil
Document type: Artículo
Approach: Teórico, aplicado
Disciplines: Física y astronomía
Keyword: Física de partículas y campos cuánticos,
Optica,
Elipsometría,
Películas delgadas
Keyword: Physics and astronomy,
Optics,
Particle physics and quantum fields,
Elipsometry,
Thin films
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