X - ray photoelectron spectroscopy ( xps ) sensitivity factors . A general and simple approach
Document title: X - ray photoelectron spectroscopy ( xps ) sensitivity factors . A general and simple approach
Journal: Revista técnica INTEVEP
Database: PERIÓDICA
System number: 000003183
ISSN: 0251-4478
Authors: 1
Institutions: 1Instituto Tecnológico Venezolano del Petróleo, Dep Desarrollo Procesos, Caracas, Distrito Federal. Venezuela
Year:
Season: Ene-Jun
Volumen: 9
Number: 1
Pages: 81-88
Country: Venezuela
Language: Inglés
Document type: Artículo
Approach: Teórico, experimental
Disciplines: Química,
Física y astronomía
Keyword: Química analítica,
Electromagnetismo,
Pruebas,
Rayos X,
Aluminio,
Magnesio,
Espectroscopía,
Fotoelectrones,
Analizadores de energía
Keyword: Chemistry,
Physics and astronomy,
Analytical chemistry,
Electromagnetism,
Tests,
X-rays,
Aluminum,
Magnesium,
Spectroscopy,
Photoelectrons,
Energy analyzer
Document request
Note: The document is shipping cost.









Original documents can be consulted at the Departamento de Información y Servicios Documentales, located in the Annex to the General Directorate of Libraries (DGB), circuito de la Investigación Científica across from the Auditorium Nabor Carrillo, located between the Institutes of Physics and Astronomy. Ciudad Universitaria UNAM. Show map
For more information: Departamento de Información y Servicios Documentales, Tels. (5255) 5622-3960, 5622-3964. E-mail: sinfo@dgb.unam.mx . Monday to Friday from (8 to 16 hrs).