Optical and electronic characterization of a zns / mg thin film system
Document title: Optical and electronic characterization of a zns / mg thin film system
Journal: Revista mexicana de física
Database: PERIÓDICA
System number: 000024426
ISSN: 0035-001X
Authors: 1
Institutions: 1Universidad Nacional Autónoma de México, Instituto de Física, Ensenada, Baja California. México
Year:
Season: Ago
Volumen: 42
Number: 4
Pages: 639-648
Country: México
Language: Inglés
Document type: Artículo
Approach: Analítico
Disciplines: Física y astronomía
Keyword: Física de materia condensada,
Optica,
Meb,
Películas,
Capas protectoras,
Caracterización óptica,
Espectroscopia de electrones
Keyword: Physics and astronomy,
Condensed matter physics,
Optics,
Sem,
Films,
Protection layers,
Electron spectroscopy,
Optic characterization
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