| Journal: | Revista mexicana de física |
| Database: | PERIÓDICA |
| System number: | 000460768 |
| ISSN: | 0035-001X |
| Authors: | Sánchez Hernández, H.H1 Pérez Abarca, J.M1 Santiago Alvarado, A2 Cruz Félix, A.S2 |
| Institutions: | 1Universidad del Papaloapan, Loma Bonita, Veracruz. México 2Universidad Tecnológica de la Mixteca, Huajuapan de León, Oaxaca. México |
| Year: | 2022 |
| Season: | May-Jun |
| Volumen: | 68 |
| Number: | 3 |
| Country: | México |
| Language: | Inglés |
| Document type: | Artículo |
| Approach: | Analítico, teórico |
| English abstract | In this paper, the amplitude and phase characteristics of internal reflection of gold nanofilms are investigated using polarization modulation of electromagnetic radiation in the Kretschmann geometry, an excited wavelength of the Surface Plasmon Resonance (SPR) at 633 nm is considered. The numerical results that are presented in this work are based on the substrate, the variation of the thickness of the dielectric and the type of plasmonic material using gold (Ag), through the ellipsometry parameters Ψ and Δ |
| Disciplines: | Física y astronomía |
| Keyword: | Optica, Plasmón de superficie, Polarización, Elipsometría, Espesor de la película |
| Keyword: | Optics, Surface plasmon, Polarization, Ellipsometry, Film thickness |
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