Structural characterization of photoluminescent porous silicon with FTIR spectroscopy
Document title: Structural characterization of photoluminescent porous silicon with FTIR spectroscopy
Journal: Brazilian journal of physics
Database: PERIÓDICA
System number: 000134440
ISSN: 0103-9733
Authors: 1
Institutions: 1Universidade de Sao Paulo, Esc. Politecnica, Lab. Microelectronica, Sao Paulo. Brasil
Year:
Season: Dic
Volumen: 27A
Number: 4
Pages: 158-161
Country: Brasil
Language: Inglés
Document type: Artículo
Approach: Analítico
Disciplines: Física y astronomía
Keyword: Física de materia condensada,
Optica,
Semiconductores,
Silicio poroso,
Fotoluminiscencia,
Espectroscopía
Keyword: Physics and astronomy,
Condensed matter physics,
Optics,
Semiconductors,
Porous silicon,
Photoluminescence,
Spectroscopy
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