| Revista: | Superficies y vacío |
| Base de datos: | PERIÓDICA |
| Número de sistema: | 000404758 |
| ISSN: | 1665-3521 |
| Autores: | Gordillo, G1 Rojas, F1 Calderón, C1 |
| Instituciones: | 1Universidad Nacional de Colombia, Departamento de Física, Bogotá. Colombia |
| Año: | 2003 |
| Periodo: | Sep |
| Volumen: | 16 |
| Número: | 3 |
| Paginación: | 30-33 |
| País: | México |
| Idioma: | Inglés |
| Tipo de documento: | Artículo |
| Enfoque: | Analítico |
| Resumen en inglés | Polycrystalline CdSx,Te1-x thin films, grown on glass substrates by co-evaporation of CdS and CdTe were characterized through spectral transmittance and x-ray diffraction measurements. The film thickness d and the optical constants were determined by simple straightforward calculations using the transmission spectrum alone. From x-ray diffraction measurements and data of the chemical composition obtained from x-ray fluorescence measurements, is shown that thin films of CdSxTe1-x mixed crystals with any composition can be obtained by this method |
| Disciplinas: | Física y astronomía, Ingeniería |
| Palabras clave: | Física de materia condensada, Ingeniería de materiales, Películas delgadas, Azufre, Cadmio, Telurio, Evaporación, Celdas solares |
| Keyword: | Physics and astronomy, Engineering, Condensed matter physics, Materials engineering, Thin films, Sulfur, Cadmium, Tellurium, Evaporation, Solar cells |
| Texto completo: | Texto completo (Ver PDF) |
