Journal: | Superficies y vacío |
Database: | PERIÓDICA |
System number: | 000404758 |
ISSN: | 1665-3521 |
Authors: | Gordillo, G1 Rojas, F1 Calderón, C1 |
Institutions: | 1Universidad Nacional de Colombia, Departamento de Física, Bogotá. Colombia |
Year: | 2003 |
Season: | Sep |
Volumen: | 16 |
Number: | 3 |
Pages: | 30-33 |
Country: | México |
Language: | Inglés |
Document type: | Artículo |
Approach: | Analítico |
English abstract | Polycrystalline CdSx,Te1-x thin films, grown on glass substrates by co-evaporation of CdS and CdTe were characterized through spectral transmittance and x-ray diffraction measurements. The film thickness d and the optical constants were determined by simple straightforward calculations using the transmission spectrum alone. From x-ray diffraction measurements and data of the chemical composition obtained from x-ray fluorescence measurements, is shown that thin films of CdSxTe1-x mixed crystals with any composition can be obtained by this method |
Disciplines: | Física y astronomía, Ingeniería |
Keyword: | Física de materia condensada, Ingeniería de materiales, Películas delgadas, Azufre, Cadmio, Telurio, Evaporación, Celdas solares |
Keyword: | Physics and astronomy, Engineering, Condensed matter physics, Materials engineering, Thin films, Sulfur, Cadmium, Tellurium, Evaporation, Solar cells |
Full text: | Texto completo (Ver PDF) |