Optical characterization of Cd(Sx,Te1-x) thin films deposited by evaporation



Título del documento: Optical characterization of Cd(Sx,Te1-x) thin films deposited by evaporation
Revista: Superficies y vacío
Base de datos: PERIÓDICA
Número de sistema: 000404758
ISSN: 1665-3521
Autors: 1
1
1
Institucions: 1Universidad Nacional de Colombia, Departamento de Física, Bogotá. Colombia
Any:
Període: Sep
Volum: 16
Número: 3
Paginació: 30-33
País: México
Idioma: Inglés
Tipo de documento: Artículo
Enfoque: Analítico
Resumen en inglés Polycrystalline CdSx,Te1-x thin films, grown on glass substrates by co-evaporation of CdS and CdTe were characterized through spectral transmittance and x-ray diffraction measurements. The film thickness d and the optical constants were determined by simple straightforward calculations using the transmission spectrum alone. From x-ray diffraction measurements and data of the chemical composition obtained from x-ray fluorescence measurements, is shown that thin films of CdSxTe1-x mixed crystals with any composition can be obtained by this method
Disciplines Física y astronomía,
Ingeniería
Paraules clau: Física de materia condensada,
Ingeniería de materiales,
Películas delgadas,
Azufre,
Cadmio,
Telurio,
Evaporación,
Celdas solares
Keyword: Physics and astronomy,
Engineering,
Condensed matter physics,
Materials engineering,
Thin films,
Sulfur,
Cadmium,
Tellurium,
Evaporation,
Solar cells
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