Surface and structural characterization of Si1-xGex/Si alloys and multi-quantum wells grown by gas source molecular beam epitaxy
Document title: Surface and structural characterization of Si1-xGex/Si alloys and multi-quantum wells grown by gas source molecular beam epitaxy
Journal: Revista mexicana de física
Database: PERIÓDICA
System number: 000169770
ISSN: 0035-001X
Authors: 1
Institutions: 1Centro de Investigaciones en Optica A.C, Unidad Aguascalientes, Aguascalientes. México
2Centro de Investigaciones en Optica A.C, León, Guanajuato. México
3Zhongnan University for Nationalities, Computer Science Department, Wuhan, Hubei. China
4Instituto Tecnológico de Aguascalientes, Departamento de Eléctrica-Electrónica, Aguascalientes. México
Year:
Season: Oct
Volumen: 46
Number: 5
Pages: 415-418
Country: México
Language: Inglés
Document type: Artículo
Approach: Analítico
Disciplines: Física y astronomía
Keyword: Física,
Física de materia condensada,
Aleaciones,
Pozos cuánticos,
Microrrugosidad,
Dispersión,
Polarización,
Caracterización estructural
Keyword: Physics and astronomy,
Condensed matter physics,
Physics,
Alloys,
Quantum wells,
Microroughness,
Scattering,
Polarization,
Structural characterization
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