Simultaneous measure of refractive index and thickness of dielectric plane parallel plates by fringe counting: a case for generalized regression
Document title: Simultaneous measure of refractive index and thickness of dielectric plane parallel plates by fringe counting: a case for generalized regression
Journal: Revista mexicana de física
Database: PERIÓDICA
System number: 000158168
ISSN: 0035-001X
Authors: 1
Institutions: 1Centro de Investigaciones en Optica A.C, León, Guanajuato. México
2Benemérita Universidad Autónoma de Puebla, Facultad de Ciencias Físico Matemáticas, Puebla. México
Year:
Season: Oct
Volumen: 45
Number: 5
Pages: 490-495
Country: México
Language: Inglés
Document type: Artículo
Approach: Analítico
Disciplines: Física y astronomía
Keyword: Física,
Optica,
Interferómetros,
Experimentos,
Interferencia,
Indice de refracción,
Dieléctricos
Keyword: Physics and astronomy,
Optics,
Physics,
Interferometers,
Experiments,
Interference,
Refractive index,
Dielectrics
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