Journal: | Revista mexicana de física |
Database: | PERIÓDICA |
System number: | 000381423 |
ISSN: | 0035-001X |
Authors: | Vázquez Leal, H1 Khan, Y2 Fernández Anaya, G3 Filobello Niño, Uriel Antonio1 Jiménez Fernández, V.M1 Herrera May, A.L4 Díaz Sánchez, Alejandro5 Marín Hernández, Alvaro6 Huerta Chua, J7 |
Institutions: | 1Universidad Veracruzana, Escuela de Instrumentación Electrónica, Jalapa, Veracruz. México 2Zhejiang University, Department of Mathematics, Zhejiang Wenzhou. China 3Universidad Iberoamericana, Departamento de Física y Matemáticas, México, Distrito Federal. México 4Universidad Veracruzana, Centro de Investigación en Micro y Nanotecnología, Boca del Río, Veracruz. México 5Instituto Nacional de Astrofísica, Optica y Electrónica, Tonantzintla, Puebla. México 6Universidad Veracruzana, Departamento de Inteligencia Artificial, Jalapa, Veracruz. México 7Universidad Veracruzana, Facultad de Ingeniería Civil, Boca del Río, Veracruz. México |
Year: | 2015 |
Season: | Ene-Feb |
Volumen: | 61 |
Number: | 1 |
Pages: | 69-73 |
Country: | México |
Language: | Inglés |
Document type: | Artículo |
Approach: | Analítico, teórico |
English abstract | Because of the exponential characteristic of silicon diodes, exact solutions cannot be established when operating point and transient analysis are computed. To overcome that problem, the present work proposes a perturbation method which allows obtaining approximated analytic expressions of diode-based circuits. Simulation results show that numerical solutions obtained by using the proposed method are similar to those reported in literature, with the advantage of not requiring a user-selected arbitrary expansion point. Additionally, the method does not use the Lambert function W, reducing the proposed solution complexity, which makes it suitable for engineering applications |
Disciplines: | Física y astronomía |
Keyword: | Física, Análisis de circuitos, Circuitos no lineales, Método de perturbación |
Keyword: | Physics and astronomy, Physics, Circuit analysis, Nonlinear circuits, Perturbation method |
Full text: | Texto completo (Ver PDF) |