Influence of oxide surface charge on the sine-voltage sweep c-v measurements
Document title: Influence of oxide surface charge on the sine-voltage sweep c-v measurements
Journal: Revista mexicana de física
Database: PERIÓDICA
System number: 000024442
ISSN: 0035-001X
Authors: 1
Institutions: 1Benemérita Universidad Autónoma de Puebla, Ctr Inv Dispositivos Semiconductores, Puebla. México
Year:
Season: Oct
Volumen: 42
Number: 5
Pages: 832-835
Country: México
Language: Inglés
Document type: Artículo
Approach: Analítico
Disciplines: Ingeniería,
Física y astronomía
Keyword: Ingeniería eléctrica,
Física de materia condensada,
MOS,
Semiconductores,
Curva de zerbst
Keyword: Engineering,
Physics and astronomy,
Electrical engineering,
Condensed matter physics,
Mos,
Zerbst curve,
Semiconductors
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