| Journal: | Revista mexicana de física |
| Database: | PERIÓDICA |
| System number: | 000447129 |
| ISSN: | 0035-001X |
| Authors: | Delgado, G.E1 Grima Gallardo, P1 Aitken, J.A2 Cabrera, H3 Cisterna, J4 Cárdenas, A4 Brito, I4 |
| Institutions: | 1Universidad de Los Andes, Facultad de Ciencias, Mérida. Venezuela 2Duquesne University, Department of Chemistry and Biochemistry, Pittsburgh, Pensilvania. Estados Unidos de América 3Istituto Nazionale di Fisica Nucleare, Trieste. Italia 4Universidad de Antofagasta, Facultad de Ciencias Básicas, Antofagasta. Chile |
| Year: | 2021 |
| Season: | Mar-Abr |
| Volumen: | 67 |
| Number: | 2 |
| Pages: | 305-311 |
| Country: | México |
| Language: | Inglés |
| Document type: | Artículo |
| Approach: | Analítico, teórico |
| English abstract | The crystal structure of the new CuFeInTe3 quaternary compound was studied by the Rietveld method from powder X-ray diffraction data. The CuFeInTe3 compound crystallize in the tetragonal CuFeInTe3-type structure with space group P 4 ¯ 2 c (N◦112), and unit cell parameters a = 6.1842(1) Å, c = 12.4163(2) Å, V = 474.85(1) Å3. The density of CuFeInTe3 is ρx = 5.753 g cm−3. The reliability factors of the Rietveld refinement results are R p = 5.5%, R wp = 6.1%, R exp = 4.7%, and S = 1.3. The powder XRD data of CuFeInTe3 are presented and the figures of merit of indexation are M 20 = 79.4 and F 30 = 43.3 (0.0045, 154) |
| Disciplines: | Física y astronomía |
| Keyword: | Física de materia condensada, Estructura cristalina, Datos de difracción de rayos X en polvo, Método de Rietveld, Chalcogenides, Semconductores, Aleaciones |
| Keyword: | Condensed matter physics, Crystal structure, Powder X-ray diffraction data, Rietveld method, Chalcogenide, Semiconductors, Alloys |
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