Materials characterization by analysis of force-distance curves: an introduction to nano-mechanical measures and experimentation for undergraduate students



Document title: Materials characterization by analysis of force-distance curves: an introduction to nano-mechanical measures and experimentation for undergraduate students
Journal: Revista mexicana de física E
Database: PERIÓDICA
System number: 000427226
ISSN: 1870-3542
Authors: 1
1
1
2
Institutions: 1Instituto Tecnológico y de Estudios Superiores de Monterrey, Departamento de Física, Monterrey, Nuevo León. México
2Universidad Autónoma de Nuevo León, Facultad de Ciencias Físico-Matemáticas, San Nicolás de los Garza, Nuevo León. México
Year:
Season: Jul-Dic
Volumen: 63
Number: 2
Country: México
Language: Inglés
Document type: Artículo
Approach: Analítico, descriptivo
English abstract We present an analysis and interpretation of force-distance curves by contact mode AFM in order to obtain the elastic modulus of different materials. For quantitative data analysis, the spring constant of the cantilever was calculated using the thermal tune method achieving consistent results. Although various assumptions were made, the computed Young’s Modulus of the samples converges with the ones found in literature. This paper is part of a series of experimental practices that serves as an introduction to the principles of nanotechnology and scientific research for third-year physics undergraduate students. During the development of this work, students are expected to reflect their knowledge and writing skills in the fields of literature review, Hertz’s contact mechanics, and computational statistics, and data analysis
Disciplines: Física y astronomía
Keyword: Física,
Fuerza atómica,
Propiedades elásticas,
Espectroscopía de fuerza,
Caracterización de superficie
Keyword: Physics,
Atomic force microscopy (AFM),
Elastic properties,
Force spectroscopy,
Surface characterization
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