Simultaneous determination of thickness and optical constants of thin films
Document title: Simultaneous determination of thickness and optical constants of thin films
Journal: Revista colombiana de física
Database: PERIÓDICA
System number: 000154581
ISSN: 0120-2650
Authors: 1
Institutions: 1n & k Technology Inc, San José, California. Estados Unidos de América
2Conner Peripherals, Milpitas, California. Estados Unidos de América
Year:
Volumen: 29
Number: 1
Pages: 19-32
Country: Colombia
Language: Inglés
Document type: Artículo
Approach: Analítico
Disciplines: Física y astronomía
Keyword: Física de materia condensada,
Optica,
Constantes ópticas,
Semiconductores,
Dieléctricos,
Películas delgadas
Keyword: Physics and astronomy,
Condensed matter physics,
Optics,
Optical constants,
Semiconductors,
Dielectrics,
Thin films
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