Caracterizacao estructural por difracao de raios X de alta resolucao de SiAlONs sinterizados com diferentes aditivos
Document title: Caracterizacao estructural por difracao de raios X de alta resolucao de SiAlONs sinterizados com diferentes aditivos
Journal: Ceramica (Sao Paulo)
Database: PERIÓDICA
System number: 000246221
ISSN: 0366-6913
Authors: 1



2
Institutions: 1Faculdade de Engenharia Quimica de Lorena, Lorena, Sao Paulo. Brasil
2University of Gwelph, Gwelph. Canadá
Year:
Season: Oct-Dic
Volumen: 51
Number: 320
Pages: 313-317
Country: Brasil
Language: Portugués
Document type: Artículo
Approach: Experimental, descriptivo
Disciplines: Ingeniería
Keyword: Ingeniería de materiales,
Nitruro de silicio,
Difracción,
Aditivos
Keyword: Engineering,
Materials engineering,
Silicon nitride,
Diffraction,
Additives
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