Sample parameters of degenerate semiconductor superlattices



Document title: Sample parameters of degenerate semiconductor superlattices
Journal: Brazilian journal of physics
Database: PERIÓDICA
System number: 000017540
ISSN: 0103-9733
Authors: 1
1
2
2
Institutions: 1Universidade de Sao Paulo, Instituto de Fisica, Sao Paulo. Brasil
2Pontificia Universidade Catolica do Rio de Janeiro, Centro de Estudos em Telecomunicacoes, Rio de Janeiro. Brasil
Year:
Season: Mar
Volumen: 26
Number: 1
Pages: 327-332
Country: Brasil
Language: Inglés
Document type: Artículo
Approach: Analítico
English abstract The Shubnikov{de Haas oscillations of InP with a periodical planar doping with Si were studied at 4.2K in elds of 0{14T. By confronting the oscillation frequencies detected experimentally with the ones predicted on the basis of the e ective mass approximation the carrier population of the superlattice minibands and the characteristic width of the doped layer were obtained. The width of the doped layer obtained in this way is in good agreement with the value obtained from CV pro ling measurements on the same structures
Disciplines: Física y astronomía,
Ingeniería
Keyword: Física de materia condensada,
Ingeniería de materiales,
Capas,
Superredes,
Semiconductores,
Oscilaciones Shubnikov-de Haas
Keyword: Physics and astronomy,
Engineering,
Condensed matter physics,
Materials engineering,
Layers,
Superlattices,
Semiconductors,
Shubnikov-de Haas oscillations
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