Sample parameters of degenerate semiconductor superlattices



Título del documento: Sample parameters of degenerate semiconductor superlattices
Revista: Brazilian journal of physics
Base de datos: PERIÓDICA
Número de sistema: 000017540
ISSN: 0103-9733
Autores: 1
1
2
2
Instituciones: 1Universidade de Sao Paulo, Instituto de Fisica, Sao Paulo. Brasil
2Pontificia Universidade Catolica do Rio de Janeiro, Centro de Estudos em Telecomunicacoes, Rio de Janeiro. Brasil
Año:
Periodo: Mar
Volumen: 26
Número: 1
Paginación: 327-332
País: Brasil
Idioma: Inglés
Tipo de documento: Artículo
Enfoque: Analítico
Resumen en inglés The Shubnikov{de Haas oscillations of InP with a periodical planar doping with Si were studied at 4.2K in elds of 0{14T. By confronting the oscillation frequencies detected experimentally with the ones predicted on the basis of the e ective mass approximation the carrier population of the superlattice minibands and the characteristic width of the doped layer were obtained. The width of the doped layer obtained in this way is in good agreement with the value obtained from CV pro ling measurements on the same structures
Disciplinas: Física y astronomía,
Ingeniería
Palabras clave: Física de materia condensada,
Ingeniería de materiales,
Capas,
Superredes,
Semiconductores,
Oscilaciones Shubnikov-de Haas
Keyword: Physics and astronomy,
Engineering,
Condensed matter physics,
Materials engineering,
Layers,
Superlattices,
Semiconductors,
Shubnikov-de Haas oscillations
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