Novel applications of secondary ion mass spectroscopy in optoelectronic materials studies
Document title: Novel applications of secondary ion mass spectroscopy in optoelectronic materials studies
Journal: Brazilian journal of physics
Database: PERIÓDICA
System number: 000007975
ISSN: 0103-9733
Authors: 1
Institutions: 1Bellcore, Red Bank, New Jersey. Estados Unidos de América
Year:
Season: Mar
Volumen: 24
Number: 1
Pages: 450-455
Country: Brasil
Language: Inglés
Document type: Artículo
Approach: Analítico
Disciplines: Física y astronomía
Keyword: Física atómica y molecular,
Física de materia condensada,
Materiales,
Semiconductores,
Optoelectrónica,
Iones secundarios,
Espectrometría de masas
Keyword: Physics and astronomy,
Atomic and molecular physics,
Condensed matter physics,
Materials,
Secondary ions,
Semiconductors,
Optoelectronics,
Mass spectrometry
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