Low angle X-ray reflection studies of InGaAs/InP multiple quantum wells
Document title: Low angle X-ray reflection studies of InGaAs/InP multiple quantum wells
Journal: Brazilian journal of physics
Database: PERIÓDICA
System number: 000134836
ISSN: 0103-9733
Authors: 1
Institutions: 1Pontificia Universidade Catolica do Rio de Janeiro, Departamento de Ciencia dos Materiais e Metalurgia, Rio de Janeiro. Brasil
2Pontificia Universidade Catolica do Rio de Janeiro, Centro de Estudos em Telecomunicacoes, Rio de Janeiro. Brasil
Year:
Season: Dic
Volumen: 27A
Number: 4
Pages: 316-318
Country: Brasil
Language: Inglés
Document type: Artículo
Approach: Analítico
Disciplines: Física y astronomía
Keyword: Física de materia condensada,
Optica,
Semiconductores,
Pozos cuánticos,
Rayos X,
Reflectometría,
Películas delgadas
Keyword: Physics and astronomy,
Condensed matter physics,
Optics,
Semiconductors,
Quantum wells,
X-rays,
Reflectometry,
Thin films
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