Journal: | Brazilian journal of physics |
Database: | PERIÓDICA |
System number: | 000007916 |
ISSN: | 0103-9733 |
Authors: | Markov, V.A1 Sokolov, L.V Pchelyakov, O.P |
Institutions: | 1Russian Academy of Sciences, Institute of Semiconductor Physics, Novosibirsk. Rusia |
Year: | 1994 |
Season: | Mar |
Volumen: | 24 |
Number: | 1 |
Pages: | 77-85 |
Country: | Brasil |
Language: | Inglés |
Document type: | Artículo |
Approach: | Analítico |
Disciplines: | Física y astronomía |
Keyword: | Física de materia condensada, Epitaxia, Elipsometría, Rheed-tecnica, Semiconductores, Nanoestructuras, Películas delgadas, Procesos-superficie |
Keyword: | Physics and astronomy, Condensed matter physics, Epitaxy, Thin films, Ellipsometry, Semiconductors, Nanostructures, Rheed technique, Surface processes |
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