EPR studies of microscopic structure of the (100) Si/SiO2 interface: current status and perspectives
Document title: EPR studies of microscopic structure of the (100) Si/SiO2 interface: current status and perspectives
Journal: Brazilian journal of physics
Database: PERIÓDICA
System number: 000132016
ISSN: 0103-9733
Authors: 1
Institutions: 1Universite de Paris VI (Pierre et Marie Curie), Groupe Physique Solides, París. Francia
Year:
Season: Jun
Volumen: 27
Number: 2
Pages: 314-324
Country: Brasil
Language: Inglés
Document type: Artículo
Approach: Analítico
Disciplines: Química,
Física y astronomía
Keyword: Fisicoquímica y química teórica,
Física de materia condensada,
RPE,
Silicio,
Estructura microscópica,
Cristales,
Interfaces
Keyword: Chemistry,
Physics and astronomy,
Physical and theoretical chemistry,
Condensed matter physics,
EPR,
Silicon,
Microscopic structure,
Crystals,
Interface
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