Determination of the Number of Graphene Layers on Different Substrates by Optical Microscopy Technique



Document title: Determination of the Number of Graphene Layers on Different Substrates by Optical Microscopy Technique
Journal: Brazilian journal of physics
Database: PERIÓDICA
System number: 000398956
ISSN: 0103-9733
Authors: 1
1
Institutions: 1Universidade Federal do ABC, Centro de Ciencias Naturais e Humanas, Sao Paulo. Brasil
Year:
Season: Dic
Volumen: 44
Number: 6
Pages: 682-686
Country: Brasil
Language: Inglés
Document type: Artículo
Approach: Analítico
English abstract We present a method, based on transmission or reflection optical microscopy, to determine the number of graphene monolayers deposited on various substrates. To demonstrate the procedure, we synthesize graphene samples and deposit them on various substrates with the micromechanical cleavage technique. Our procedure initially relies on more classical approaches such as atomic force microscopy (AFM) and Raman to calibrate the equipment. After calibration, however, optical microscopy by itself is sufficient to characterize other samples, deposited on any substrate
Disciplines: Física y astronomía
Keyword: Física de materia condensada,
Nanoestructuras,
Grafeno,
Microscopía óptica,
Microscopía de fuerza atómica
Keyword: Physics and astronomy,
Condensed matter physics,
Nanostructures,
Graphene,
Optical microscopy,
Atomic force microscopy
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