| Revista: | Brazilian journal of physics |
| Base de datos: | PERIÓDICA |
| Número de sistema: | 000398956 |
| ISSN: | 0103-9733 |
| Autores: | Obelenis, F1 Champi, A1 |
| Instituciones: | 1Universidade Federal do ABC, Centro de Ciencias Naturais e Humanas, Sao Paulo. Brasil |
| Año: | 2014 |
| Periodo: | Dic |
| Volumen: | 44 |
| Número: | 6 |
| Paginación: | 682-686 |
| País: | Brasil |
| Idioma: | Inglés |
| Tipo de documento: | Artículo |
| Enfoque: | Analítico |
| Resumen en inglés | We present a method, based on transmission or reflection optical microscopy, to determine the number of graphene monolayers deposited on various substrates. To demonstrate the procedure, we synthesize graphene samples and deposit them on various substrates with the micromechanical cleavage technique. Our procedure initially relies on more classical approaches such as atomic force microscopy (AFM) and Raman to calibrate the equipment. After calibration, however, optical microscopy by itself is sufficient to characterize other samples, deposited on any substrate |
| Disciplinas: | Física y astronomía |
| Palabras clave: | Física de materia condensada, Nanoestructuras, Grafeno, Microscopía óptica, Microscopía de fuerza atómica |
| Keyword: | Physics and astronomy, Condensed matter physics, Nanostructures, Graphene, Optical microscopy, Atomic force microscopy |
| Texto completo: | Texto completo (Ver PDF) |
