| Revista: | Memoria Electro - Congreso Internacional de Ingeniería Electrónica |
| Base de datos: | PERIÓDICA |
| Número de sistema: | 000274929 |
| ISSN: | 1405-2172 |
| Autores: | Gallegos, Jose Mario1 Villalobos, Leda Villalobos, J. René Cabrera, Sergio D |
| Instituciones: | 1University of Texas, Center of Electronics Manufacturing, El Paso, Texas. Estados Unidos de América |
| Año: | 1996 |
| Periodo: | Oct |
| Volumen: | 18 |
| Paginación: | 520-525 |
| País: | México |
| Idioma: | Inglés |
| Tipo de documento: | Artículo |
| Enfoque: | Aplicado |
| Resumen en inglés | On-line industrial inspection applications often require error levels near zero to allow proper monitoring of the underlying manufacturing system. This is particularly true in automated visual inspection of circuit priented boards populated with surface mounted devices (SMD). Under this constrain, any effort to improve the inspection systems's reliability and repeatability is justified if it can comply with certain limitations such as speed and cost. in order to decrease the error level it is useful to combine the information of multiple tests into a multi-feature vector. This vector decision approach is used instead of a sequence of tests to made a decision regarding the presence/absence of te components. If the features used are loosely correlated with each other then the effect of one or more anomalous features is lessened by the rest of the components of the vector, provided that not all the features are erroneous |
| Disciplinas: | Matemáticas |
| Palabras clave: | Matemáticas aplicadas, Algoritmos, Vectores, Inspección visual, Algoritmos secuenciales, Vectores de decisión |
| Keyword: | Mathematics, Applied mathematics, Algorithms, Vectors, Visual inspection, Sequential algorithms, Decision vectors |
| Solicitud del documento | |
