| Revue: | Materials research |
| Base de datos: | PERIÓDICA |
| Número de sistema: | 000312695 |
| ISSN: | 1516-1439 |
| Autores: | Bacichetti-Junior, Antonio Leondino1 Lente, Manuel Henrique Eiras, Jose Antonio Mendes, Ricardo Gonçalves2 Paulin-Filho, Pedro Iris |
| Instituciones: | 1Universidade Federal de Sao Carlos, Departamento de Fisica, Sao Carlos, Sao Paulo. Brasil 2Universidade Federal de Sao Carlos, Departamento de Engenharia de Materiais, Sao Carlos, Sao Paulo. Brasil |
| Año: | 2004 |
| Periodo: | Abr-Jun |
| Volumen: | 7 |
| Número: | 2 |
| Paginación: | 363-367 |
| País: | Brasil |
| Idioma: | Inglés |
| Tipo de documento: | Nota breve o noticia |
| Enfoque: | Experimental |
| Resumen en inglés | Different methods have been proposed in the literature to deposit PZT thin films. Among these, chemical based processes have been revealed as a promising preparation route due to their low cost processing and the facility for controlling the stoichiometry of complex systems. The objective of this work was to investigate the influence of the time and temperature of crystallization on the physical properties of the Pb(Zr0.53Ti0.47)O3 thin films prepared by a hybrid method. The structural and microstructural dependence on the crystallization conditions of the PZT films were investigated by X-ray diffraction and atomic force microscopy. Dielectric and ferroelectric properties were also characterized and their behaviors were related to the structural evolution of films |
| Disciplinas: | Ingeniería |
| Palabras clave: | Ingeniería de materiales, Ingeniería mecánica, Cerámica, Películas delgadas, Ferroeléctricos, Tratamiento térmico, Cristalización, Propiedades eléctricas |
| Keyword: | Engineering, Materials engineering, Mechanical engineering, Ceramics, Thin films, Ferroelectrics, Thermal treatment, Crystallization, Electrical properties |
| Texte intégral: | Texto completo (Ver HTML) |
