Nanocolumnar CdS thin films grown by glancing angle deposition from a sublimate vapor effusion source



Título del documento: Nanocolumnar CdS thin films grown by glancing angle deposition from a sublimate vapor effusion source
Revue: Journal of applied research and technology
Base de datos: PERIÓDICA
Número de sistema: 000427962
ISSN: 1665-6423
Autores: 1
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Instituciones: 1Instituto Politécnico Nacional, Centro de Investigación y de Estudios Avanzados, Mérida, Yucatán. México
2Universidad Autónoma de Yucatán, Facultad de Ingeniería, Mérida, Yucatán. México
Año:
Periodo: Jun
Volumen: 15
Número: 3
País: México
Idioma: Inglés
Tipo de documento: Artículo
Enfoque: Aplicado, descriptivo
Resumen en inglés The glancing angle deposition (GLAD) technique was used to grow cadmium sulfide (CdS) thin films on glass and indium tin oxide (ITO)-coated glass substrates from a sublimate vapor effusion source. The samples were prepared under different incident deposition flux angles (α) of 0o, 20o and 80o, while both the substrate and the source were under rotation. The temperature of the source was 923.15 K. Scanning electron microscopy images showed that the GLAD method combined with the source produced dense nanocolumnar structures with height and diameters of ∼200 and∼30 nm, respectively. The deposited films displayed a hexagonal structure with preferential (002) plane orientation and crystallites sizes between∼25 nm and ∼35 nm. A maximum solar weighted transmission of ∼92% was obtained for the sample prepared at α = 80o, with a substrate/sourcerotation velocity ratio of 55/20 in the wavelength region of 400-900 nm. The average band-gap energy of the films was ∼2.42 eV. Refractive indexes between ∼1.4 and ∼2.4 at a 550 nm the wavelength was also obtained
Disciplinas: Ingeniería
Palabras clave: Ingeniería de materiales,
Deposición de ángulo oblicuo,
Sulfuro de cadmio,
Nanoestructuras,
Películas delgadas,
Propiedades estructurales
Keyword: Materials engineering,
Glancing angle deposition,
Cadmium sulfide,
Nanostructures,
Thin films,
Structural properties
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