| Revue: | Brazilian journal of physics |
| Base de datos: | PERIÓDICA |
| Número de sistema: | 000154134 |
| ISSN: | 0103-9733 |
| Autores: | Sessler, G.M1 Yang, G.M |
| Instituciones: | 1University of Technology, Darmstadt, Hessen. Alemania |
| Año: | 1999 |
| Periodo: | Jun |
| Volumen: | 29 |
| Número: | 2 |
| Paginación: | 233-240 |
| País: | Brasil |
| Idioma: | Inglés |
| Tipo de documento: | Artículo |
| Enfoque: | Analítico |
| Resumen en inglés | Recent studies of charge trapping and charge transport in spolymer films irradiated and charged with monoenergetic electrons of range smaller than the sample thickness and thereafter stored or annealed under various conditions are discussed. An analytical model used to describe the phenomena takes the following parameters into consideration: Charge and energy deposition profiles, charge drift due to a shallow-trap-modulated mobility, deep trapping without release, trap filling due to a finite trap density, and ohmic relaxation due to a radiation-induced conductivity during irradiation and its delayed component after irradiation. The model calculations show the effect of various parameters on the shape of the initial charge distribution and on its evolution with annealing time. - Experiments with the laser-induced pressure-pulse (LIPP) method on 12 and 25 mm thick fluorocarbon and polymide films, charged with 10 or keV electron beams, respectively, yield the charge distributions after irradiation and the changes of the distributions due to annealing of the samples at 120oC for various times. A comparison of experimental and analytical results reveals the trapping kinetics and permits to estimate the deep-trap density and the mt-product, where m is the trap-modulated mobilit and t is the trapping time |
| Disciplinas: | Física y astronomía |
| Palabras clave: | Física de materia condensada, Polímeros, Películas, Dinámica de carga, Irradiación de electrónes, Dieléctricos |
| Keyword: | Physics and astronomy, Condensed matter physics, Polymers, Films, Charge dynamics, Electron irradiation, Dielectrics |
| Texte intégral: | Texto completo (Ver HTML) |
