Metodologia para análise de perfis de difracao de raios-X: alisamento, determinacao do tamanho médio de cristalito (*)



Document title: Metodologia para análise de perfis de difracao de raios-X: alisamento, determinacao do tamanho médio de cristalito (*)
Journal: Ceramica (Sao Paulo)
Database: PERIÓDICA
System number: 000428417
ISSN: 0366-6913
Year:
Season: Nov-Dic
Volumen: 41
Number: 272
Pages: 133-136
Country: Brasil
Language: Portugués
Document type: Nota breve o noticia
Approach: Analítico
Disciplines: Física y astronomía
Keyword: Difracción de rayos X,
Cristalografía de rayos X,
Transformada de Fourier,
Cristales
Keyword: X-ray diffraction,
Fourier transform,
Crystals,
X-ray crystallography
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