New improved technique to measure photoreflectance
Document title: New improved technique to measure photoreflectance
Journal: Brazilian journal of physics
Database: PERIÓDICA
System number: 000017524
ISSN: 0103-9733
Authors: 1
Institutions: 1Pontificia Universidade Catolica do Rio de Janeiro, Departamento de Física, Rio de Janeiro. Brasil
2Pontificia Universidade Catolica do Rio de Janeiro, Ctr Estudos Telecomunicacoes, Rio de Janeiro. Brasil
Year:
Season: Mar
Volumen: 26
Number: 1
Pages: 252-255
Country: Brasil
Language: Inglés
Document type: Artículo
Approach: Analítico
Disciplines: Física y astronomía
Keyword: Física de materia condensada,
Optica,
Cristales,
Superficies,
Semiconductores,
Fotorreflectancia
Keyword: Physics and astronomy,
Condensed matter physics,
Optics,
Crystals,
Surfaces,
Semiconductors,
Photoreflectance
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