| Revista: | Revista mexicana de física |
| Base de datos: | PERIÓDICA |
| Número de sistema: | 000425830 |
| ISSN: | 0035-001X |
| Autores: | Fermin, José R1 |
| Instituciones: | 1Universidad del Zulia, Facultad de Ciencias, Maracaibo, Zulia. Venezuela |
| Año: | 2017 |
| Periodo: | Mar-Abr |
| Volumen: | 63 |
| Número: | 2 |
| País: | México |
| Idioma: | Inglés |
| Tipo de documento: | Artículo |
| Enfoque: | Analítico, teórico |
| Resumen en inglés | Here we report on the effect of the ferromagnetic (FM) and antiferromagnetic (AF) films thicknesses on the exchange bias field in a FM/AF bilayer. For this, a series of NiFe(t NiFe)/NiO(t NiO) bilayers were grown by DC magnetron sputtering onto commercial Si(001) wafers. Magneto-optical hysteresis loops were used as probes to measure the exchange-bias field, and the coercivity field, as functions of the in-plane angle, φ H, and the films’ thicknesses, t NiFe and t NiO. The in-plane symmetry of the exchange field and coercivity display unidirectional and uniaxial anisotropies, with angular dependences different from the simple c o s φ H and c o s 2 φ H, respectively. These symmetries are intrinsically sensitive to the thickness of both NiFe and NiO layers. With respect to the FM layer thickness, the exchange bias and coercivity field follow the usual 1/t NiFe, while the dependence on the thickness of the AF layer is more complicated, and is characterized by a critical behavior |
| Disciplinas: | Física y astronomía |
| Palabras clave: | Física, Sesgo de cambio, Anisotropía unidireccional, Bicapas Nife/NiO, Materiales magnéticos de polarización, Simetría de sesgo de intercambio |
| Keyword: | Exchange-bias, Unidirectional anisotropy, NiFe/NiO bilayers, Magnetic biasing materials, Exchange bias symmetry |
| Texto completo: | Texto completo (Ver HTML) Texto completo (Ver PDF) |
