Revista: | Revista mexicana de física |
Base de datos: | PERIÓDICA |
Número de sistema: | 000425830 |
ISSN: | 0035-001X |
Autores: | Fermin, José R1 |
Instituciones: | 1Universidad del Zulia, Facultad de Ciencias, Maracaibo, Zulia. Venezuela |
Año: | 2017 |
Periodo: | Mar-Abr |
Volumen: | 63 |
Número: | 2 |
País: | México |
Idioma: | Inglés |
Tipo de documento: | Artículo |
Enfoque: | Analítico, teórico |
Resumen en inglés | Here we report on the effect of the ferromagnetic (FM) and antiferromagnetic (AF) films thicknesses on the exchange bias field in a FM/AF bilayer. For this, a series of NiFe(t NiFe)/NiO(t NiO) bilayers were grown by DC magnetron sputtering onto commercial Si(001) wafers. Magneto-optical hysteresis loops were used as probes to measure the exchange-bias field, and the coercivity field, as functions of the in-plane angle, φ H, and the films’ thicknesses, t NiFe and t NiO. The in-plane symmetry of the exchange field and coercivity display unidirectional and uniaxial anisotropies, with angular dependences different from the simple c o s φ H and c o s 2 φ H, respectively. These symmetries are intrinsically sensitive to the thickness of both NiFe and NiO layers. With respect to the FM layer thickness, the exchange bias and coercivity field follow the usual 1/t NiFe, while the dependence on the thickness of the AF layer is more complicated, and is characterized by a critical behavior |
Disciplinas: | Física y astronomía |
Palabras clave: | Física, Sesgo de cambio, Anisotropía unidireccional, Bicapas Nife/NiO, Materiales magnéticos de polarización, Simetría de sesgo de intercambio |
Keyword: | Exchange-bias, Unidirectional anisotropy, NiFe/NiO bilayers, Magnetic biasing materials, Exchange bias symmetry |
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