Superficial characterization of a TiO2 - TiN0.26 layer implanted in Titanium



Título del documento: Superficial characterization of a TiO2 - TiN0.26 layer implanted in Titanium
Revista: Superficies y vacío
Base de datos: PERIÓDICA
Número de sistema: 000395224
ISSN: 1665-3521
Autores: 1
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2
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Instituciones: 1Instituto Tecnológico de Toluca, Toluca, Estado de México. México
2Instituto Nacional de Investigaciones Nucleares, México, Distrito Federal. México
Año:
Periodo: Sep
Volumen: 20
Número: 3
Paginación: 11-16
País: México
Idioma: Inglés
Tipo de documento: Artículo
Enfoque: Analítico
Resumen en inglés Samples of pure Titanium were treated by means a PIII process using a dense DC glow discharge with different mixtures of nitrogen-oxygen and oxygen pure. The surface of treated samples was analyzed by means of different techniques such as X-ray diffractometry, Scanning Electron Microscope, Vickers Microhardness tester and profilometer. We conclude that the modified surface is formed by TiN0.26 diffused into TiO2 in rutile phase, forming a uniform layer up to 10 μm in thickness and whose resultant microhardness is almost five times greater than that of untreated titanium. Some control over the superficial parameters is taken by varying the proportion of nitrogen-oxygen at a pressure of 1x10-2 Torr (~1.33 Pa), obtaining a thicker layer, a harder surface or a reduced roughness. The identified phases have biocompatible properties, which provide interest in the bioengineering field
Disciplinas: Física y astronomía,
Ingeniería
Palabras clave: Física,
Ingeniería de materiales,
Películas delgadas,
Modificación de superficies,
Implantación de iones,
Plasma,
Tribología,
Titanio
Keyword: Physics and astronomy,
Engineering,
Physics,
Materials engineering,
Thin films,
Surface modification,
Ion implantation,
Plasma,
Tribology,
Titanium
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