| Revista: | Journal of technology management & innovation |
| Base de datos: | CLASE |
| Número de sistema: | 000342928 |
| ISSN: | 0718-2724 |
| Autores: | Wen-Cheng, Lu1 Jong-Rong, Chen2 I-Hsuan, Tung2 |
| Instituciones: | 1Ming Chuan University, Taoyuan County. Taiwán 2National Central University, Graduate Institute of Industrial Economics, Jhongli City. Taiwán |
| Año: | 2009 |
| Volumen: | 4 |
| Número: | 2 |
| Paginación: | 69-81 |
| País: | Chile |
| Idioma: | Inglés |
| Tipo de documento: | Artículo |
| Enfoque: | Analítico, descriptivo |
| Resumen en inglés | This study analyzes patent trends and volatilities for three heterogeneous quality patents in the Taiwan patent system from January 1973 to June 2006. The estimated models are symmetric GARCH (1,1) and asymmetric EGARCH (1,1), providing full sample, rolling sample, and out-of-sample evidence. Three different patent types exhibit increasing trends, using monthly time series data from our samples. ”New design” patents also show time-varying volatility but other types of patents fail to reject the ARCH LM test. Findings show the asymmetric EGARCH (1,1) model suitable for “new design” patent type through out of sample forecasts management |
| Disciplinas: | Economía |
| Palabras clave: | Economía industrial, Taiwán, Patentes, Innovación tecnológica |
| Texto completo: | Texto completo (Ver HTML) |
