| Revista: | Brazilian journal of physics |
| Base de datos: | PERIÓDICA |
| Número de sistema: | 000310521 |
| ISSN: | 0103-9733 |
| Autores: | Capote, Gil1 Bonetti, Luis F2 Santos, Lucia V Trava-Airoldi, Vladimir J Corat, Evaldo J |
| Instituciones: | 1Instituto Nacional de Pesquisas Espaciais, Laboratorio Associado de Sensores e Materiais, Sao Jose dos Campos, Sao Paulo. Brasil 2Instituto Tecnologico de Aeronautica, Centro Tecnico Aeroespacial, Sao Jose dos Campos, Sao Paulo. Brasil |
| Año: | 2006 |
| Periodo: | Sep |
| Volumen: | 36 |
| Número: | 3B |
| Paginación: | 986-989 |
| País: | Brasil |
| Idioma: | Inglés |
| Tipo de documento: | Artículo |
| Enfoque: | Experimental, aplicado |
| Resumen en inglés | Adherent and low-stress a-C:H films were deposited on Ti6Al4V and stainless steel substrates using PECVD and IBAD techniques. An amorphous silicon interlayer was applied to improve the adhesion of the a-C:H films on the metal substrates. The XPS technique was employed to analyze the chemical bondings within the interfaces. The elemental composition and atomic density of the films were determined by ion beam analysis. The film microstructure was studied by means of Raman scattering spectroscopy. The mechanical properties were determined by means of stress and hardness measurements. The adherence was evaluated by means of scratch tests. The tests showed that the composition, the microstructure, and the mechanical properties of the films depend on the intensity of the ion bombardment and on the ion current |
| Disciplinas: | Ingeniería |
| Palabras clave: | Ingeniería de materiales, Diamante, Deposición química de vapor, Haces de iones, Recubrimientos |
| Keyword: | Engineering, Materials engineering, Diamond, Chemical vapor deposition, Ion beams, Coatings |
| Texto completo: | Texto completo (Ver HTML) |
