A tight-binding study of acceptor levels in semiconductors



Título del documento: A tight-binding study of acceptor levels in semiconductors
Revista: Brazilian journal of physics
Base de datos: PERIÓDICA
Número de sistema: 000159247
ISSN: 0103-9733
Autores: 1
Instituciones: 1Universidade Federal do Rio de Janeiro, Instituto de Física, Rio de Janeiro. Brasil
Año:
Periodo: Dic
Volumen: 29
Número: 4
Paginación: 779-784
País: Brasil
Idioma: Inglés
Tipo de documento: Artículo
Enfoque: Analítico
Resumen en inglés Acceptor binding energies in zinc-blende semiconductors are determined within the tight-binding formalism. The importance of fitting the valence-band masses in the (100) as well as (111) directions is discussed, and parametrizations that specifically fit the valence-band anisotropy are used to calculate Ge acceptor levels in AlxGa1-x As alloys. The sensitivity of the calculated energies to the parameters that determine bulk masses is investigated, as well as the effect of varying the on-site energy of the impurity. A comparison is made between first-neighbor and second-neighbor hopping models. For shallow levels, both approaches give the same results. For deeper levels, however, important differences arise. Experimental evidence suggests that first-neighbor models are better suited for describing intermediate to deep levels
Disciplinas: Física y astronomía
Palabras clave: Física de materia condensada,
Semiconductores,
Niveles de energía,
Aceptores,
Zincblenda,
Impurezas
Keyword: Physics and astronomy,
Condensed matter physics,
Semiconductors,
Energy levels,
Acceptors,
Zincblende,
Impurities
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