| Revista: | Superficies y vacío |
| Base de datos: | PERIÓDICA |
| Número de sistema: | 000404819 |
| ISSN: | 1665-3521 |
| Autores: | Horley, P.P1 Vorobiev, Y.V1 Khomyak, V.V2 Gorley, V.V2 Bilichuk, S.V2 González Hernández, J3 |
| Instituciones: | 1Instituto Politécnico Nacional, Centro de Investigación y de Estudios Avanzados, Querétaro. México 2Yuriy Fedkovych Chernivtsi National University, Department of Physical Electronics and Non-Traditional Energy Sources, Chernivtsi. Ucrania 3Centro de Investigación en Materiales Avanzados S.C., Chihuahua. México |
| Año: | 2004 |
| Periodo: | Sep |
| Volumen: | 17 |
| Número: | 3 |
| Paginación: | 12-16 |
| País: | México |
| Idioma: | Inglés |
| Tipo de documento: | Artículo |
| Enfoque: | Analítico |
| Resumen en inglés | The paper discusses the results of structural and optical investigations of CuInxGa1-xSe2 (CIGS) semiconductor films with molar composition 0≤x≤1 obtained by thermal evaporation in vacuum. Experimental methods used to characterize the materials included ellipsometry measurements in the 250-800 nm wavelength range and X-ray structural analysis, which proved the polycrystalline nature of the films with chalcopyrite structure and a preferred direction (112). Surface investigation performed with SEM and AFM reported rough character of the film surface. Spectral dependence of real and imaginary parts of dielectric constant was investigated using Kramers-Kronig relation. It was shown that for the spectral range λ<0.5µm, the dielectric components of CuIn0.2Ga0.8Se2 do not obey the principle of causality, which could be a consequence of light scattering peculiarities over statistically uneven film surface. The position of energy levels of the valence band of CuIn0.2Ga0.8Se2 was estimated for the wavelengths 0.50<λ<0.84µm |
| Disciplinas: | Física y astronomía, Ingeniería |
| Palabras clave: | Física de materia condensada, Ingeniería de materiales, Películas delgadas, Semiconductores, Cobre, Indio, Galio, Selenio, Elipsometría, Calcopirita, Dieléctricos, Pulverización catódica |
| Keyword: | Physics and astronomy, Engineering, Condensed matter physics, Materials engineering, Thin films, Semiconductors, Copper, Indium, Gallium, Selenium, Ellipsometry, Chalcopyrite, Dielectrics, Sputtering |
| Texto completo: | Texto completo (Ver PDF) |
