| Revista: | Quimica nova |
| Base de datos: | PERIÓDICA |
| Número de sistema: | 000196059 |
| ISSN: | 0100-4042 |
| Autores: | Transferetti, Benedito Claudio1 Davanzo, Celso Ulysses |
| Instituciones: | 1Universidade Estadual de Campinas, Instituto de Quimica, Campinas, Sao Paulo. Brasil |
| Año: | 2001 |
| Periodo: | Ene-Feb |
| Volumen: | 24 |
| Número: | 1 |
| Paginación: | 99-104 |
| País: | Brasil |
| Idioma: | Portugués |
| Tipo de documento: | Artículo |
| Enfoque: | Teórico, divulgación |
| Resumen en inglés | This paper is the second part of an article aimed to present theoretical basis as well as some applications of two infrared reflection techniques: specular reflection and reflection-absorption. It is emphasyzed how much spectral simulation can aid spectral analysis. The usefulness of reflection-absorption spectroscopy as a thin film caracterization technique is stressed. Optical effects such as LO-TO splittings and their observation as Berreman effect are also addressed |
| Disciplinas: | Química |
| Palabras clave: | Química analítica, Reflexión, Reflexión especular, Efecto Berreman, Infrarrojo, Simulación espectral, Reflexión-absorción, Caracterización química |
| Keyword: | Chemistry, Analytical chemistry, Reflection, Specular reflection, Berreman effect, Infrared, Spectral simulation, Reflection- absorption, Chemical characterization |
| Texto completo: | Texto completo (Ver HTML) |
