| Revista: | Materials research |
| Base de datos: | PERIÓDICA |
| Número de sistema: | 000312466 |
| ISSN: | 1516-1439 |
| Autores: | Mendes, R.G1 Araujo, E.B2 Eiras, J.A |
| Instituciones: | 1Universidade Federal de Sao Carlos, Departamento de Engenharia de Materiais, Sao Carlos, Sao Paulo. Brasil 2Universidade Estadual Paulista "Julio de Mesquita Filho", Departamento de Fisica e Quimica, Ilha Solteira, Sao Paulo. Brasil |
| Año: | 2001 |
| Volumen: | 4 |
| Número: | 2 |
| Paginación: | 113-116 |
| País: | Brasil |
| Idioma: | Inglés |
| Tipo de documento: | Artículo |
| Enfoque: | Experimental |
| Resumen en inglés | Strontium barium niobate (SBN) thin films of good quality were deposited on Pt/Ti/SiO2/Si substrate using a polymeric resin containing metallic ions. Films were crystallized at different temperatures and for different duration of time. The structure of these films was studied using X-ray diffraction. The coexistence of SrNb2O6 (SN) and SBN was observed in films crystallized at 700 °C. The amount of SN decreases when the crystallization time increases. Ferroelectric properties were determined for films crystallized at 700 °C for 1 and 5 h. For SBN film crystallized at 700 °C for 1 h, the remanent polarization (Pr) and the coercive field (Ec) were 2.6 muC/cm² and 71.9 kV/cm, respectively. For the film crystallized at 700 °C for 5 h these parameters were Pr = 1.1 muC/cm² and Ec = 50.5 kV/cm |
| Disciplinas: | Ingeniería, Química |
| Palabras clave: | Ingeniería de materiales, Química de polímeros, Niobio, Control de calidad, Películas delgadas, Estructuras |
| Keyword: | Engineering, Chemistry, Materials engineering, Polymer chemistry, Niobium, Quality control, Thin films, Structures |
| Texto completo: | Texto completo (Ver HTML) |
