| Revista: | Materials research |
| Base de datos: | PERIÓDICA |
| Número de sistema: | 000312489 |
| ISSN: | 1516-1439 |
| Autores: | Marinkovic, Bojan1 Avillez, Roberto Ribeiro de Saavedra, Alvaro Assuncao, Fernando Cosme Rizzo |
| Instituciones: | 1Pontificia Universidade Catolica do Rio de Janeiro, Departamento de Ciencia dos Materiais e Metalurgia, Rio de Janeiro. Brasil |
| Año: | 2001 |
| Volumen: | 4 |
| Número: | 2 |
| Paginación: | 71-76 |
| País: | Brasil |
| Idioma: | Inglés |
| Tipo de documento: | Artículo |
| Enfoque: | Experimental |
| Resumen en inglés | The fundamental parameters approach is used to simulate the instrument contribution to the X-Ray diffraction profile. This procedure eliminates the need to experimentally prepare a reference sample of the studied crystalline material when using the Warren-Averbach method to investigate microstrutural parameters. The Warren-Averbach method is also compared to the Balzar and Enzo methods, two other popular methods of size-strain analysis. The analysis was carried out using bohmite powder having two different nominal average crystallite sizes, 80 Å and 200 Å. A 50%-50% mixture of these materials was used as a third sample. The proposed simulation procedure provides good results and is much faster to implement than the usual procedure that includes the preparation of a reference. For larger crystallite sizes, the results calculated from the Warren-Averbach method for the volume-weighted average crystallite size differs significantly from the ones obtained from the Balzar and Enzo methods. The limitations of the Balzar and Enzo methods are also discussed |
| Disciplinas: | Ingeniería, Química |
| Palabras clave: | Ingeniería de materiales, Química de polímeros, Policristales, Difracción de rayos X |
| Keyword: | Engineering, Chemistry, Materials engineering, Polymer chemistry, Polycrystals, X-ray diffraction |
| Texto completo: | Texto completo (Ver HTML) |
