Multi-resolution Laws’ Masks based texture classification



Título del documento: Multi-resolution Laws’ Masks based texture classification
Revista: Journal of applied research and technology
Base de datos: PERIÓDICA
Número de sistema: 000427811
ISSN: 1665-6423
Autores: 1
1
Instituciones: 1Veer Surendra Sai University Of Technology, Department of Electronics and Telecommunication Engineering, Sambalpur, Odisha. India
Año:
Periodo: Dic
Volumen: 15
Número: 6
País: México
Idioma: Inglés
Tipo de documento: Artículo
Enfoque: Experimental, aplicado
Resumen en inglés Wavelet transforms are widely used for texture feature extraction. For dyadic transform, frequency splitting is coarse and the orientation selection is even poorer. Laws’ mask is a traditional technique for extraction of texture feature whose main approach is towards filtering of images with five types of masks, namely level, edge, spot, ripple, and wave. With each combination of these masks, it gives discriminative information. A new approach for texture classification based on the combination of dyadic wavelet transform with different wavelet basis functions and Laws’ masks named as Multi-resolution Laws’ Masks (MRLM) is proposed in this paper to further improve the performance of Laws’ mask descriptor. A k-Nearest Neighbor (k-NN) classifier is employed to classify each texture into appropriate class. Two challenging databases Brodatz and VisTex are used for the evaluation of the proposed method. Extensive experiments show that the Multi-resolution Laws’ Masks can achieve better classification accuracy than existing dyadic wavelet transform and Laws’ masks methods
Disciplinas: Ciencias de la computación
Palabras clave: Procesamiento de datos,
Procesamiento de imágenes,
Extracción de formas,
Clasificación de texturas,
Transformada Wavelet
Keyword: Data processing,
Image processing,
Wavelet transform,
Feature extraction,
Texture classification
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