| Revista: | Journal of applied research and technology |
| Base de datos: | PERIÓDICA |
| Número de sistema: | 000427650 |
| ISSN: | 1665-6423 |
| Autores: | Viton Zorrilla, Luighi1 Lezama, Jinmi1 Acosta, Rubén1 Ríos Julcapoma, Milton1 |
| Instituciones: | 1Universidad Nacional de Ingeniería, Instituto Nacional de Investigación y Capacitación de Telecomunicaciones, Lima. Perú |
| Año: | 2018 |
| Periodo: | Jun |
| Volumen: | 16 |
| Número: | 3 |
| País: | México |
| Idioma: | Inglés |
| Tipo de documento: | Artículo |
| Enfoque: | Aplicado, descriptivo |
| Resumen en inglés | This paper describes the design and implementation of an alternative system to measure electrical parameters (voltage and current) in order to characterize MOSFET-Like sensors. To design a signal conditioning circuit is necessary to understand the sensor behavior, therefore knowing its characteristics is essential. As sensor manufacturers do not usually provide the whole technical information about them, a measurement system is proposed to obtain those sensor characteristics with the aim of modeling the sensor device. This system is based on a MCU which generates voltages and measures currents via an external transimpedance amplifier, and it is supported by a software platform developed upon python based open source tools. Such combination offers a low cost system to stimulate and capture sensor responses which could be processed later to extract the characteristic parameters. The system was tested principally with an fon Sensitive Field Effect Transistor (1SFET) and results show the VDS-IDS and Ves curves obtained with it |
| Disciplinas: | Ingeniería |
| Palabras clave: | Ingeniería eléctrica, Circuitos eléctricos, Sensores, Sistemas de medición |
| Keyword: | Electrical engineering, Electric circuits, Sensors, Measurement systems |
| Texto completo: | Texto completo (Ver HTML) Texto completo (Ver PDF) |
