Photon energy shift in the luminescence of highly excited Ga1-xAlxAs:Si due to Auger effect involvement



Título del documento: Photon energy shift in the luminescence of highly excited Ga1-xAlxAs:Si due to Auger effect involvement
Revista: Superficies y vacío
Base de datos: PERIÓDICA
Número de sistema: 000404989
ISSN: 1665-3521
Autors: 1
1
Institucions: 1Benemérita Universidad Autónoma de Puebla, Facultad de Ciencias de la Electrónica, Puebla. México
Any:
Període: Dic
Volum: 16
Número: 4
Paginació: 34-36
País: México
Idioma: Inglés
Tipo de documento: Artículo
Enfoque: Analítico
Resumen en inglés A new bonding state in highly doped and almost compensated semiconductors, the {donor-acceptor1-acceptor2}- AUGER molecule, and its existence region is determined in silicon-doped Ga1-xAlxAs by electron-beam excited luminescence measurements at low temperature. The main peak position and luminescence intensity of the donoracceptor recombination channel turns out to be affected in a characteristic manner by the existence of AUGER molecules at high excitation levels. Carrier transitions via two recombination channels can be generated, which involve the donor-acceptor pair transition at 1.8 eV, and a free-to-bound transition at 2.1 eV. We discuss luminescence data of Ga0.2Al0.8As, doped with 3⋅1018 cm-3 silicon atoms. Sample excitation is carried out by means of a focused electron beam inside a nitrogen cryostat. Experimental results are analyzed by use of a set of rate equations, incorporating a particular bonding state and an AUGER process. Good agreement between theoretical and experimental results is established
Disciplines Física y astronomía,
Ingeniería
Paraules clau: Física de materia condensada,
Ingeniería de materiales,
Ingeniería electrónica,
Semiconductores,
Estado sólido,
Luminiscencia,
Silicio
Keyword: Physics and astronomy,
Engineering,
Condensed matter physics,
Electronic engineering,
Materials engineering,
Semiconductors,
Solid state,
Luminescence,
Silicon
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