| Revista: | Superficies y vacío |
| Base de datos: | PERIÓDICA |
| Número de sistema: | 000404759 |
| ISSN: | 1665-3521 |
| Autors: | Jiménez Pérez, J.L1 Cruz Orea, A2 Mendoza Alvarez, J.G2 |
| Institucions: | 1Instituto Politécnico Nacional, Centro de Investigación en Ciencia Aplicada y Tecnología Avanzada, México, Distrito Federal. México 2Instituto Politécnico Nacional, Centro de Investigación y de Estudios Avanzados, México, Distrito Federal. México |
| Any: | 2003 |
| Període: | Sep |
| Volum: | 16 |
| Número: | 3 |
| Paginació: | 34-37 |
| País: | México |
| Idioma: | Inglés |
| Tipo de documento: | Artículo |
| Enfoque: | Analítico |
| Resumen en inglés | We have studied TiO2 track thin films grown on Ti films previously deposited over glass substrates. The Ti films were heated in air by a moving laser beam, with different intensities of a pulsed Nd:YAG laser that sweeps the Ti surface at a 2 mm/s constant speed. We observed differences in the photoacoustic (PA) signal amplitude measured on the different TiO2 tracks which are due to differences in the TiO2 thickness for the growth thin films. This result showed that it is possible to follow the qualitative behavior of the oxide films with reasonable accuracy, using the present photoacoustic analysis. On the other hand, micro-Raman spectra measured for these TiO2 samples showed two strong bands at 424 cm-1 and 612 cm- 1 associated to the TiO2 rutile structure. These results showed that both, the PA and Raman spectra give us useful information for the TiO2 tracks characterization |
| Disciplines | Física y astronomía, Ingeniería |
| Paraules clau: | Física de materia condensada, Ingeniería de materiales, Películas delgadas, Dióxido de titanio, Titanio, Espectroscopía, Fotoacústica |
| Keyword: | Physics and astronomy, Engineering, Condensed matter physics, Materials engineering, Thin films, Titanium dioxide, Titanium, Spectroscopy, Photoacoustics |
| Text complet: | Texto completo (Ver PDF) |
