| Revista: | Quimica nova |
| Base de datos: | PERIÓDICA |
| Número de sistema: | 000313249 |
| ISSN: | 0100-4042 |
| Autors: | Piovesan, Erick1 Hidalgo, Angel Alberto Marletta, Alexandre Vega, Maria Leticia2 Ruggiero, Reinaldo3 |
| Institucions: | 1Universidade Federal de Uberlandia, Instituto de Fisica, Uberlandia, Minas Gerais. Brasil 2Universidade de Sao Paulo, Instituto de Fisica de Sao Carlos, Sao Carlos, Sao Paulo. Brasil 3Universidade Federal de Uberlandia, Instituto de Quimica, Uberlandia, Minas Gerais. Brasil |
| Any: | 2006 |
| Període: | Sep |
| Volum: | 29 |
| Número: | 5 |
| Paginació: | 916-921 |
| País: | Brasil |
| Idioma: | Portugués |
| Tipo de documento: | Artículo |
| Enfoque: | Experimental, aplicado |
| Resumen en inglés | In this report, we studied the thickness effect on the optical and morphological properties of self-assembled (SA) poly(p-phenylenevinylene) (PPV) films, wich were processed with 5 and 75 layers from a PPV precursor polymer and dodecylbenzenesulfonate, and then, thermally converted at 230°C. The increase of the film thickness yielded more intense peaks in the vibrational spectral range. The electron-phonon coupling was quantified by the Huang - Rhys factor, that shows the effects on the polymer chain mobility in the interface substrate/polymer. A strong emission anisotropy r=0.57 was observed for the film with 5 layers of thickness decreasing to 0.34 for the film with 75 layers. Finally, the surface topology of the films was measured using Atomic Force Microscopy |
| Disciplines | Química |
| Paraules clau: | Química de polímeros, Poli(p-fenilen vinileno), Películas autoensambladas, Grosor |
| Keyword: | Chemistry, Polymer chemistry, Poly(p-phenylene vinylene), Self-assembled films, Thickness |
| Text complet: | Texto completo (Ver HTML) |
